Title :
Technique for measuring facet reflectivity and effective index of laser diode amplifiers
Author :
Goldberg, L. ; Tamburrini, M. ; Mehuys, D.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
A simple method for unambiguous measurement of the effective index, single pass gain and residual facet reflectivity of semiconductor amplifiers is described. The technique relies on propagation of narrow beams injected at an angle into broad area semiconductor amplifier.
Keywords :
optical variables measurement; reflectivity; refractive index measurement; semiconductor junction lasers; broad area semiconductor amplifier; facet reflectivity measurement; laser diode amplifiers; propagation of narrow beams; refractive index measurement; residual facet reflectivity; semiconductor amplifiers; single pass gain;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910997
