DocumentCode
1087578
Title
IIB-5 practical limitations of gate-oxide thickness minimization in the MOSFET
Author
Yu-Pin Han ; Mize, J.P. ; Pinto, Joel ; Worley, Rick
Volume
30
Issue
11
fYear
1983
fDate
11/1/1983 12:00:00 AM
Firstpage
1573
Lastpage
1574
Keywords
CMOS technology; Constraint theory; Degradation; Low voltage; MOSFET circuits; Nonvolatile memory; Pulsed power supplies; Random access memory; SONOS devices; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1983.21353
Filename
1483254
Link To Document