Title :
IIB-6 a fast write low voltage non-volatile RAM
Author :
Haken, R.A. ; Coleman, D.J.
fDate :
11/1/1983 12:00:00 AM
Keywords :
CMOS process; CMOS technology; Interface states; Low voltage; Nonvolatile memory; Oxidation; Pulsed power supplies; Random access memory; SONOS devices; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21354
