Title :
IIIB-2 quantification of photon generation in CMOS VLSI structures
Author :
Gerosa, G. ; Stern, Sebastian ; Bastani, B. ; Chwang, R.
fDate :
11/1/1983 12:00:00 AM
Keywords :
Current measurement; Hot carriers; Impact ionization; MOSFETs; Optical microscopy; Optical scattering; P-n junctions; Particle scattering; Silicon; Very large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21365
