Title :
IIIB-5 current characterization of SCR latch-up in CMOS circuits
Author :
Kokkonen, Kimmo ; Matthews, Adrian ; Henning, A.
fDate :
11/1/1983 12:00:00 AM
Keywords :
CMOS process; Circuits; Fabrication; Ion implantation; Performance analysis; Substrates; Temperature; Testing; Thyristors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1983.21367
