DocumentCode :
1087763
Title :
IIIB-4 analysis on selective writing for Taper isolated RAM cell
Author :
Kurosawa, Shunsuke ; Ishijima, Tatsuo ; Takada, Masumi ; Terada, Kenji ; Suzuki, Satoshi
Volume :
30
Issue :
11
fYear :
1983
fDate :
11/1/1983 12:00:00 AM
Firstpage :
1582
Lastpage :
1582
Keywords :
Analytical models; Boron; Impurities; Laboratories; MOSFET circuits; Microelectronics; Performance analysis; Testing; Thyristors; Writing;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1983.21368
Filename :
1483269
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1087763
