For InGaAsP/InP devices emitting in the wavelength range of

m, we present novel and accurate analytical approximations of the crucial parameters in laser design: the radiation confinement factor

; the effective refractive index N
eff; and the transverse beamwidth

. It is found that

is independent of wavelength or step-index difference and

becomes independent of wavelength as the active layer thicknesses

decreases below 0.15 μm. An explicit analytical expression is derived for the threshold current density J
th. The new linear gain-current relationship

(cm
-1) = 28.5

is deduced from a critical assessment of recent experimental data. A theoretical framework is provided to explain experimental observations such as: the J
thversus

curve is independent of wavelength, the threshold has a negligible variation over the

m active-layer thickness range, and the normalized threshold current density (

, for

m) varies strongly (3-5 kA/cm
2/μm) with cavity length.