For InGaAsP/InP devices emitting in the wavelength range of 

 m, we present novel and accurate analytical approximations of the crucial parameters in laser design: the radiation confinement factor 

 ; the effective refractive index N
eff; and the transverse beamwidth 

 . It is found that 

 is independent of wavelength or step-index difference and 

 becomes independent of wavelength as the active layer thicknesses 

 decreases below 0.15 μm. An explicit analytical expression is derived for the threshold current density J
th. The new linear gain-current relationship 

 (cm
-1) = 28.5 

 is deduced from a critical assessment of recent experimental data. A theoretical framework is provided to explain experimental observations such as: the J
thversus 

 curve is independent of wavelength, the threshold has a negligible variation over the 

 m active-layer thickness range, and the normalized threshold current density ( 

 , for 

 m) varies strongly (3-5 kA/cm
2/μm) with cavity length.