Title :
Architectural-Level Power Optimization of Microcontroller Cores in Embedded Systems
Author :
Saponara, Sergio ; Fanucci, Luca ; Terreni, Pierangelo
Author_Institution :
Dept. of Inf. Eng., Pisa Univ.
Abstract :
Power saving is becoming one of the major design drivers in electronic systems embedding microcontroller cores. Known microcontrollers typically save power at the expense of reduced computational capability. With reference to an 8051 core, this paper presents a novel clustered clock gating to increase power efficiency at architectural level without performance loss and preserving the reusability of the macrocell. Different from known clustered-gating strategies where the number of clusters is fixed a priori, the optimal cluster organization is derived, considering both the macrocell complexity and switching activity. When implementing the 8051 core in CMOS technology, the proposed approach leads to a 37% power saving, which is higher than the 29% permitted by automatic-clock-gating insertion in commercial computer-aided design tools or the 10% of state-of-the-art clustered-gating strategies. To assess its full functionality, the power-optimized cell has been proved in silicon that is embedded in an automotive system for sensors interface/control
Keywords :
CMOS digital integrated circuits; automotive electronics; embedded systems; logic CAD; microcontrollers; system-on-chip; CMOS digital circuits; architectural-level power optimization; automotive electronics; clustered clock gating; computer-aided design tools; electronic systems; embedded systems; microcontroller cores; optimal cluster organization; power efficiency; power saving; sensor control; sensor interface; Automotive engineering; CMOS technology; Clocks; Design automation; Driver circuits; Embedded system; Macrocell networks; Microcontrollers; Performance loss; Silicon; Automotive electronics; CMOS; embedded systems; hardware design languages (HDLs); low power; microcontrollers;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2006.885450