DocumentCode :
1088150
Title :
On concurrent error location and correction of FFT networks
Author :
Oh, Choong Gun ; Youn, Hee Yong
Author_Institution :
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Volume :
2
Issue :
2
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
257
Lastpage :
260
Abstract :
Fault tolerance has been one of the major issues for the VLSI based FFT networks. In this paper, two efficient approaches for concurrent error location and correction of FFT networks are proposed. Using our approach, a faulty component can be located at an additional try followed by log/sub 2/m comparisons of m corrupted outputs. An error can also be corrected, once it is detected, at a small modification of basic module with an additional try. Moreover, our approaches are general in the sense that they can be implemented with any concurrent error detection scheme employing a checksum approach for FFT networks.<>
Keywords :
VLSI; circuit reliability; digital signal processing chips; error correction; error detection; fast Fourier transforms; fault tolerant computing; DSP chips; FFT networks; VLSI based networks; checksum approach; concurrent error correction; concurrent error location; fault tolerance; Discrete Fourier transforms; Error correction; Fast Fourier transforms; Fault detection; Fault tolerant systems; Hardware; Oral communication; Spectral analysis; Throughput; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.285753
Filename :
285753
Link To Document :
بازگشت