• DocumentCode
    1088162
  • Title

    VB-6 N-channel MOSFETS fabricated in silicon-on-oxide using a scanning E-beam line source

  • Author

    Chen, J.Y. ; Rensch, D.B.

  • Volume
    30
  • Issue
    11
  • fYear
    1983
  • fDate
    11/1/1983 12:00:00 AM
  • Firstpage
    1606
  • Lastpage
    1606
  • Keywords
    Boron; Circuit testing; Dielectric substrates; FETs; Fabrication; MOSFETs; Nitrogen; Silicon; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1983.21402
  • Filename
    1483303