• DocumentCode
    1088280
  • Title

    VIB-1 modeling of single particle soft error generation in bipolar random access memories

  • Author

    Zoutendyk, John A.

  • Author_Institution
    California Institute of Technology, Pasadena, CA
  • Volume
    30
  • Issue
    11
  • fYear
    1983
  • fDate
    11/1/1983 12:00:00 AM
  • Firstpage
    1612
  • Lastpage
    1612
  • Keywords
    Bipolar transistor circuits; Circuit simulation; Computer simulation; Integrated circuit modeling; Nuclear and plasma sciences; Process design; Propulsion; Random access memory; Read-write memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1983.21412
  • Filename
    1483313
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1088280