DocumentCode :
1088566
Title :
Application of submillimeter wave lasers to high voltage cable inspection
Author :
Cantor, Arnold J. ; Cheo, Peter K. ; Foster, Martin C. ; Newman, Leon A.
Author_Institution :
United Technologies Research Center, East Hartford, CT
Volume :
17
Issue :
4
fYear :
1981
fDate :
4/1/1981 12:00:00 AM
Firstpage :
477
Lastpage :
489
Abstract :
An experimental device designed for real-time, nondestructive inspection of cross-linked polyethylene insulation during cable manufacture has been built, analyzed, and tested under laboratory conditions. The device detects scattered far-infrared (FIR) laser energy at 118.8 μm from imperfections, such as voids and contaminants, known to have a serious deleterious influence on cable in-service lifetime. As presently configured, the device can readily detect voids as small as 100 μm in diameter in a cable 2.8 cm in diameter moving past the sensor at 5 cm/s. Better performance of the liquid helium cooled Ga-doped Ge detectors could lead to a significant improvement in void detection capability.
Keywords :
Electromagnetic (EM) scattering; Inspection; Laser applications; Polyethylene-insulated cables, cross-linked; Power cable insulation testing; Submillimeter-wave lasers; Submillimeter-wave measurements; Cable insulation; Inspection; Insulation testing; Laboratories; Manufacturing; Nondestructive testing; Polyethylene; Scattering; Submillimeter wave devices; Voltage;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1981.1071133
Filename :
1071133
Link To Document :
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