Microstrip with dielectric overlay: variational analysis and validation

Author

Joshi, K.K. ; Pollard, R.D. ; Postoyalko, V.

Author_Institution

Dept. of Electron. & Electr. Eng., Leeds Univ., UK

Volume

141

Issue

2

fYear

1994

fDate

4/1/1994 12:00:00 AM

Firstpage

138

Lastpage

140

Abstract

A variational technique for the analysis of microstrip with dielectric overlay/cover in the Fourier transform domain is investigated with special reference to the strip thickness dependence. The effective permittivity calculated for different overlay thicknesses and permittivities indicates a mode change from quasi-TEM to TEM as the effect of strip width disappears in agreement with full wave spectral domain analysis. Experimental data on multilayer microstrip effective permittivity and numerical results are found to agree for various microwave bulk materials. Based on this software, with the advantage of easier implementation and faster computation a method has been suggested to determine the microwave permittivity of the bulk and thick film materials with minimum fabrication complexity

Keywords

Fourier transforms; dielectric materials; microstrip lines; permittivity; thick film devices; variational techniques; Fourier transform domain; bulk materials; dielectric cover; dielectric overlay; effective permittivity; microstrip; microwave bulk materials; microwave permittivity; multilayer microstrip; quasi-TEM mode; software; strip thickness; thick film materials; variational analysis;

fLanguage

English

Journal_Title

Microwaves, Antennas and Propagation, IEE Proceedings

Publisher

iet

ISSN

1350-2417

Type

jour

DOI

10.1049/ip-map:19949907

Filename

285813