Title :
Recognition and pose estimation of unoccluded three-dimensional objects from a two-dimensional perspective view by banks of neural networks
Author :
Khotanzad, Alireza ; Liou, James J H
Author_Institution :
Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
fDate :
7/1/1996 12:00:00 AM
Abstract :
This paper describes a neural network (NN) based system for recognition and pose estimation of an unoccluded three-dimensional (3-D) object from any single two-dimensional (2-D) perspective view. The approach is invariant to translation, orientation, and scale. First, the binary silhouette of the object is obtained and normalized for translation and scale. Then, the object is represented by a set of rotation invariant features derived from the complex orthogonal pseudo-Zernike moments of the image. The recognition scheme combines the decisions of a bank of multilayer perceptron NN classifiers operating in parallel on the same data. These classifiers have different topologies and internal parameters, but are trained on the same set of exemplar perspective views of the objects. Next, two pose parameters, elevation and aspect angles, are obtained by a novel two-stage NN system consisting of a quadrant classifier followed by NN angle estimators. Performance is tested on clean and noisy data bases of military ground vehicles. Comparative studies with three other classifiers (a single NN, the weighted nearest-neighbor classifier, and a binary decision tree) are carried out
Keywords :
image classification; multilayer perceptrons; object recognition; angle estimators; binary decision tree; binary silhouette; complex orthogonal pseudo-Zernike moment; multilayer perceptron NN classifiers; neural network based system; pose estimation; quadrant classifier; rotation invariant features; two-dimensional perspective view; unoccluded three-dimensional objects; weighted nearest-neighbor classifier; Cameras; Classification tree analysis; Infrared detectors; Land vehicles; Multilayer perceptrons; Neural networks; Noise level; Testing; Topology; Two dimensional displays;
Journal_Title :
Neural Networks, IEEE Transactions on