• DocumentCode
    1089143
  • Title

    Transistors made in single-crystal SOI films

  • Author

    Colinge, J.P. ; Demoulin, E. ; Bensahel, D. ; Auvert, G. ; Morel, H.

  • Author_Institution
    CNET, Meylan, France
  • Volume
    4
  • Issue
    4
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    75
  • Lastpage
    77
  • Abstract
    Test transistors with gate lengths ranging from 10 to 4 µm were made in laser-recrystallized silicon on insulator films. A capping layer of patterned antireflecting stripes of Si3N4was used to grow large single-crystals of silicon. MOS transistors show good electrical characteristics and a surface mobility up to 650 cm2/V.s for electrons. With the exception of the recrystallization procedure, the wafers followed a fully standard NMOS process, including the growth of a LOCOS field oxide.
  • Keywords
    Argon; Circuits; Electron mobility; Grain boundaries; MOS devices; MOSFETs; Power lasers; Semiconductor films; Silicon on insulator technology; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25654
  • Filename
    1483398