DocumentCode :
1089296
Title :
Switching conditions for CMOS latch-up path with shunt resistances
Author :
Pattanayak, D.N. ; Kinoshita, G. ; Nelson, J.H. ; Wong, Y.
Author_Institution :
Rockwell International, Anaheim, CA
Volume :
4
Issue :
4
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
116
Lastpage :
119
Abstract :
Analytical expressions for the switching points of a one-dimensional p-n-p-n representation for a CMOS latch-up path are obtained without the traditional simplifying assumptions. A new criterion for the holding current is established. The results are applicable to the general case where the emitting junctions are shunted by resistances, as well as the simple p-n-p-n structure. The "holding current" of the path is discussed in some detail and predicted values are compared to those obtained experimentally.
Keywords :
CMOS integrated circuits; Computer science; Delay; Genetic expression; Helium; Low voltage; P-n junctions; Resistors; Switches; Testing;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25669
Filename :
1483413
Link To Document :
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