Title :
Switching conditions for CMOS latch-up path with shunt resistances
Author :
Pattanayak, D.N. ; Kinoshita, G. ; Nelson, J.H. ; Wong, Y.
Author_Institution :
Rockwell International, Anaheim, CA
fDate :
4/1/1983 12:00:00 AM
Abstract :
Analytical expressions for the switching points of a one-dimensional p-n-p-n representation for a CMOS latch-up path are obtained without the traditional simplifying assumptions. A new criterion for the holding current is established. The results are applicable to the general case where the emitting junctions are shunted by resistances, as well as the simple p-n-p-n structure. The "holding current" of the path is discussed in some detail and predicted values are compared to those obtained experimentally.
Keywords :
CMOS integrated circuits; Computer science; Delay; Genetic expression; Helium; Low voltage; P-n junctions; Resistors; Switches; Testing;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25669