Title :
Short-channel effects in 0.5-µm source-drain spaced vertical GaAs FET´s—A first experimental investigation
Author :
Kohn, E. ; Mishra, U. ; Eastman, L.F.
Author_Institution :
Domaine de Corbeville, Orsay, France
fDate :
4/1/1983 12:00:00 AM
Abstract :
The output characteristics of vertical GaAs MESFET´s with a 0.5 µm source-drain spacing are discussed. It is found that the measured pinch-off voltage is substantially larger than the one expected from the geometrical Schottky diode pinch-off, and current limiting surface depletion effects are not observed.
Keywords :
Current limiters; Current measurement; Doping; Electrodes; Electrons; FETs; Gallium arsenide; MESFETs; Schottky diodes; Voltage measurement;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25672