DocumentCode :
1089321
Title :
Short-channel effects in 0.5-µm source-drain spaced vertical GaAs FET´s—A first experimental investigation
Author :
Kohn, E. ; Mishra, U. ; Eastman, L.F.
Author_Institution :
Domaine de Corbeville, Orsay, France
Volume :
4
Issue :
4
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
125
Lastpage :
127
Abstract :
The output characteristics of vertical GaAs MESFET´s with a 0.5 µm source-drain spacing are discussed. It is found that the measured pinch-off voltage is substantially larger than the one expected from the geometrical Schottky diode pinch-off, and current limiting surface depletion effects are not observed.
Keywords :
Current limiters; Current measurement; Doping; Electrodes; Electrons; FETs; Gallium arsenide; MESFETs; Schottky diodes; Voltage measurement;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25672
Filename :
1483416
Link To Document :
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