• DocumentCode
    1089406
  • Title

    High temperature characteristics of bipolar mode power JFET operation

  • Author

    Baliga, B.J.

  • Author_Institution
    General Electric Company, Schenectady, NY
  • Volume
    4
  • Issue
    5
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    143
  • Lastpage
    145
  • Abstract
    The high-temperature operating characteristics of high-voltage JFET devices operated in the bipolar mode are evaluated. Good forward blocking capability with no degradation in blocking gain is observed at up to 200°C. The on-resistance and gate turnoff time of the devices was found to double from 25°C to 200°C, and the current gain was found to decrease by 30 percent. Despite the increase in gate drive requirements with increasing temperature, these devices should still be attractive for high-speed power switching applications because their on-resistance per unit area is at least 10 time lower than that of the power MOSFET.
  • Keywords
    Degradation; Electrons; FETs; Fingers; MOSFET circuits; Power MOSFET; Solar energy; Solids; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25681
  • Filename
    1483425