DocumentCode
1089406
Title
High temperature characteristics of bipolar mode power JFET operation
Author
Baliga, B.J.
Author_Institution
General Electric Company, Schenectady, NY
Volume
4
Issue
5
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
143
Lastpage
145
Abstract
The high-temperature operating characteristics of high-voltage JFET devices operated in the bipolar mode are evaluated. Good forward blocking capability with no degradation in blocking gain is observed at up to 200°C. The on-resistance and gate turnoff time of the devices was found to double from 25°C to 200°C, and the current gain was found to decrease by 30 percent. Despite the increase in gate drive requirements with increasing temperature, these devices should still be attractive for high-speed power switching applications because their on-resistance per unit area is at least 10 time lower than that of the power MOSFET.
Keywords
Degradation; Electrons; FETs; Fingers; MOSFET circuits; Power MOSFET; Solar energy; Solids; Temperature; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1983.25681
Filename
1483425
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