Title :
High temperature characteristics of bipolar mode power JFET operation
Author_Institution :
General Electric Company, Schenectady, NY
fDate :
5/1/1983 12:00:00 AM
Abstract :
The high-temperature operating characteristics of high-voltage JFET devices operated in the bipolar mode are evaluated. Good forward blocking capability with no degradation in blocking gain is observed at up to 200°C. The on-resistance and gate turnoff time of the devices was found to double from 25°C to 200°C, and the current gain was found to decrease by 30 percent. Despite the increase in gate drive requirements with increasing temperature, these devices should still be attractive for high-speed power switching applications because their on-resistance per unit area is at least 10 time lower than that of the power MOSFET.
Keywords :
Degradation; Electrons; FETs; Fingers; MOSFET circuits; Power MOSFET; Solar energy; Solids; Temperature; Voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25681