DocumentCode :
1089693
Title :
High-speed logic at 300K with self-aligned submicrometer-gate GaAs MESFET´s
Author :
Sadler, R.A. ; Eastman, L.F.
Author_Institution :
Cornell University, Ithaca, NY
Volume :
4
Issue :
7
fYear :
1983
fDate :
7/1/1983 12:00:00 AM
Firstpage :
215
Lastpage :
217
Abstract :
The fastest room-temperature logic gate operation yet reported has been achieved with an improved technology for self-aligned ion-implanted GaAs MESFET\´s. The procedure involves fabrication of 0.75/0.6-µm "T-gate" structures using electron-beam lithography, and employs arsenic-overpressure capless annealing of the self-aligned n+-implant. Minimum propagation delays of 15.4 ps/ stage were obtained for several of the ring oscillators, and none of the oscillators fabricated showed propagation delays longer than 17.0 ps. The fabrication technology and experimental results are described.
Keywords :
Annealing; Circuits; Etching; Gallium arsenide; Implants; Logic; MESFETs; Ring oscillators; Substrates; Thermal stresses;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25710
Filename :
1483454
Link To Document :
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