DocumentCode
108987
Title
Analytical model for threshold-base current of a transistor laser with multiple quantum wells in the base
Author
Basu, Rohini ; Mukhopadhyay, Bodhibrata ; Basu, Palash Kumar
Author_Institution
Inst. of Radio Phys. & Electron., Univ. of Calcutta, Kolkata, India
Volume
7
Issue
3
fYear
2013
fDate
Jun-13
Firstpage
71
Lastpage
76
Abstract
The authors investigate in this study the effect of incorporating multiple quantum wells (QWs) in the base of a heterojunction bipolar transistor laser on its performance. The expression for the terminal current is obtained by solving continuity equation in the base relating the bulk carrier density with the two-dimensional (2D) carrier density via virtual states. The gain in the QW is obtained by considering strain, 2D density-of-states, polarisation dependent momentum matrix element, Fermi statistics and Lorentzian broadening. The authors have taken as the basis for comparison the calculated as well as the experimental threshold-base current of 21.5 mA for a 16 nm wide InGaAs QW in GaAs base placed at 59 nm away from the emitter junction. Calculated value of 7.06 mA for three 16 nm wide QWs placed at 29, 59 and 79 nms in the base indicate substantial reduction in threshold-base current. Calculations are also made for three QWs of different widths having variable barrier widths. Reduction of threshold-base current by different amounts is observed in all cases.
Keywords
Fermi level; III-V semiconductors; carrier density; electronic density of states; gallium arsenide; heterojunction bipolar transistors; indium compounds; quantum well lasers; semiconductor device models; 2D density-of-states; Fermi statistics; InGaAs; InGaAs quantum wells; Lorentzian broadening; bulk carrier density; continuity equation; current 21.5 mA; current 7.06 mA; emitter junction; heterojunction bipolar transistor laser; multiple quantum wells; size 16 cm; substantial reduction; threshold-base current; two-dimensional carrier density; virtual states;
fLanguage
English
Journal_Title
Optoelectronics, IET
Publisher
iet
ISSN
1751-8768
Type
jour
DOI
10.1049/iet-opt.2012.0039
Filename
6588668
Link To Document