Title :
Semiconductor laser noise in an interferometer system
Author :
Petermann, K. ; Weidel, Edgar
Author_Institution :
Technische Univ. Berlin, West Germany
fDate :
7/1/1981 12:00:00 AM
Abstract :
The noise of semiconductor laser light after passing a Michelson interferometer has been measured for gain guided as well as index guided double-heterostructure injection lasers. This noise is mainly due to the partition noise and the frequency noise of the laser emission. Unless the interferometer is perfectly balanced, the observed noise is several orders of magnitude larger than the usual intensity noise of semiconductor lasers.
Keywords :
Laser noise; Optical interferometry; Semiconductor lasers; Fiber lasers; Frequency; Interference; Laser modes; Laser noise; Optical interferometry; Optical noise; Optical sensors; Semiconductor device noise; Semiconductor lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1981.1071262