DocumentCode :
1089907
Title :
Surface Raman ellipsometry
Author :
Eesley, Gary L.
Author_Institution :
DepElectro-optical Engineering Division,Hughes Aircraft Company,Culver City,CA
Volume :
17
Issue :
7
fYear :
1981
fDate :
7/1/1981 12:00:00 AM
Firstpage :
1285
Lastpage :
1292
Abstract :
A method for achieving the ultrahigh sensitivity required for surface vibrational spectroscopy is proposed. Polarization selective heterodyne detection permits shot-noise limited submonolayer detection with classically noisy picosecond laser sources. Furthermore, the polarization selectivity is used to eliminate the overwhelming thermally induced changes in surface reflecfivity.
Keywords :
Raman spectroscopy; Surfaces; Ellipsometry; Polarization; Probes; Pump lasers; Raman scattering; Reflectivity; Rough surfaces; Spectroscopy; Stimulated emission; Surface roughness;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1981.1071264
Filename :
1071264
Link To Document :
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