DocumentCode :
1090096
Title :
An optically defined 1.3-µm NMOS ring oscillator
Author :
Sunami, H. ; Shimohigashi, K. ; Hashimoto, N.
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
4
Issue :
9
fYear :
1983
fDate :
9/1/1983 12:00:00 AM
Firstpage :
311
Lastpage :
313
Abstract :
n-channel enhancement/depletion (E/D) gate MOS ring-oscillators (RO) based on 1.3- and 2-µm layout design rules have been fabricated using 10:1 reduction projection aligner. A delay/stage of 80 ps and a power-delay product of 3.6 fJ have been obtained for a 401-stage RO consisting of 1.3-µm feature-size devices.
Keywords :
Electron optics; MOS devices; Optical devices; Optical films; Ring oscillators; Threshold voltage; Wet etching;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1983.25745
Filename :
1483489
Link To Document :
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