Title :
A novel wavelet transform technique for on-line partial discharge measurements. 2. On-site noise rejection application
Author :
Zhang, Hao ; Blackburn, T.R. ; Phung, B.T. ; Sen, D.
Author_Institution :
Sch. of Electr. Eng. & Telecommun., New South Wales Univ., Kensington, NSW
Abstract :
For pt.I see ibid., p.3-14, (2007). Insulation assessment of HV cables requires continuous partial discharge (PD) monitoring to identify the nature of insulation defects and to determine any degradation trends. However to recover PD signals with sufficient sensitivity to determine such insulation degradation in substations with high levels of electromagnetic interference is a major challenge. This paper is the second of two papers addressing this challenge for on-line PD measurements in a noisy environment. The first paper described a wavelet transform-based method of interference rejection. This paper applies that method to the problem of on-site testing, using both laboratory tests and on-site tests. The laboratory tests were used to stimulate the noisy on-site testing environment, with use of transient pulse-like noise, discrete spectral interference (DSI) and white noise. These noise types have been successfully rejected by the method proposed in the first paper. In addition, on-site tests have been undertaken and have been able to detect PD signals in an old 11 kV substation multi-cable installation
Keywords :
insulation testing; interference suppression; partial discharge measurement; power cable insulation; power cable testing; signal denoising; signal detection; substation insulation; wavelet transforms; 11 kV; PD signal detection; discrete spectral interference; electromagnetic interference; insulation assessment; insulation defects; noise rejection; on-line partial discharge measurements; on-site testing; substation multicable installation; wavelet transform technique; white noise; Cable insulation; Continuous wavelet transforms; Degradation; Interference; Partial discharge measurement; Partial discharges; Substations; Testing; Wavelet transforms; Working environment noise;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2007.302865