A contribution to the measurement of permittivity with the short-circuited line method

Author

Iglesias, T.P. ; Seoane, A. ; Rivas, J.

Author_Institution

Dept. de Fisica Aplicada, Vigo Univ., Spain

Volume

43

Issue

1

fYear

1994

fDate

2/1/1994 12:00:00 AM

Firstpage

13

Lastpage

17

Abstract

The elimination of the ambiguity in the short-circuited line method for determining the dielectric permittivity by measuring the change in the position of the minimum for two similar frequencies is studied. This quantity is used to uniquely determine the coefficients of an algebraic equation with a single physical solution. Ambiguity may or may not be removed depending on the dielectric characteristics of the sample and on the value of the ratio sample thickness/wavelength. The former are not known a priori and the latter is an experimental parameter, which can be varied. The influence of this parameter on the elimination of ambiguity is studied. Finally the analysis is compared to results of measurements on several organic liquids

Keywords

coaxial cables; microwave measurement; organic compounds; permittivity measurement; TEM waves; algebraic equation; analytical model; dielectric permittivity; measurement of permittivity; microwave measurement; organic liquids; ratio sample thickness; short-circuited line method; wavelength; Circuits; Dielectric measurements; Differential algebraic equations; Frequency measurement; Liquids; Permittivity measurement; Position measurement; Transmission line measurements; Transmission line theory; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.286347

Filename

286347