Title :
Robust algorithms for Txx network analyzer self-calibration procedures
Author :
Heuermann, Holger ; Schiek, Burkhard
Author_Institution :
Inst. fur Hochfrequenztech., Ruhr-Univ., Bochum, Germany
fDate :
2/1/1994 12:00:00 AM
Abstract :
A closed-form theory for performing a network analyzer calibration using different Txx procedures is presented. This theory makes it possible to describe all known self-calibration procedures with the same algorithm. The improved properties of this general TAN method in contrast to the conventional TAN procedure are shown by numerical and experimental results
Keywords :
calibration; digital simulation; microwave measurement; microwave reflectometry; network analysers; TRL; TSD; Txx network analyzer; closed-form theory; general TAN method; redundancy; robust algorithms; self-calibration; Algorithm design and analysis; Attenuators; Calibration; Equations; Performance analysis; Position measurement; Robustness; Scattering parameters; Switches; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
