DocumentCode
1090316
Title
Robust algorithms for Txx network analyzer self-calibration procedures
Author
Heuermann, Holger ; Schiek, Burkhard
Author_Institution
Inst. fur Hochfrequenztech., Ruhr-Univ., Bochum, Germany
Volume
43
Issue
1
fYear
1994
fDate
2/1/1994 12:00:00 AM
Firstpage
18
Lastpage
23
Abstract
A closed-form theory for performing a network analyzer calibration using different Txx procedures is presented. This theory makes it possible to describe all known self-calibration procedures with the same algorithm. The improved properties of this general TAN method in contrast to the conventional TAN procedure are shown by numerical and experimental results
Keywords
calibration; digital simulation; microwave measurement; microwave reflectometry; network analysers; TRL; TSD; Txx network analyzer; closed-form theory; general TAN method; redundancy; robust algorithms; self-calibration; Algorithm design and analysis; Attenuators; Calibration; Equations; Performance analysis; Position measurement; Robustness; Scattering parameters; Switches; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.286348
Filename
286348
Link To Document