• DocumentCode
    1090348
  • Title

    Electrode Plasmas During Self-Magnetic-Pinch E-Beam Diode Operation

  • Author

    Critchley, Andrew Duncan James ; Heathcote, Alan D. ; Johnston, Mark D.

  • Author_Institution
    Atomic Weapons Establ. Aldermaston, Hydrodynamic Sci. Group, Reading
  • Volume
    36
  • Issue
    4
  • fYear
    2008
  • Firstpage
    1214
  • Lastpage
    1215
  • Abstract
    Framing camera images of optical emission spectra from self-magnetic-pinch (SMP) diodes are presented, which illustrate the evolution of the anode (A) and cathode (K) plasmas during diode operation. These data were taken one frame per shot at different times during the X-ray pulses of standard configuration SMPs fired on the RITS-6 pulsed power driver. The images display the output from a five-fiber array, observing emission from discrete intervals along the diode´s axis of symmetry. The array output was passed through an imaging spectrograph before being captured by an intensified charge-coupled-device camera gating for 20 ns. The images provide a qualitative understanding of the relative densities and temperatures of the A-K plasmas as they cross the A-K gap and collapse the diode impedance, ceasing the X-ray output. The overwhelming majority of the emission was continuum in nature; line emission was observed while the continuum emission was still weak. The observations are briefly discussed in the context of future diode research.
  • Keywords
    electron beam applications; pinch effect; plasma diodes; radiography; visible spectroscopy; RITS-6 pulsed power driver; X-ray pulses; anode plasmas; anode-cathode gap; camera image framing; cathode plasmas; charge-coupled-device camera; electrode plasmas; electron-beam applications; imaging spectrograph; optical emission spectra; optical spectroscopy; radiography; self-magnetic-pinch E-beam diode operation; Electron-beam applications; optical spectroscopy; radiography;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.917169
  • Filename
    4461117