DocumentCode :
1090370
Title :
Comparative analysis of low-pass filters for the demodulation of projected gratings in 3-D adaptive profilometry
Author :
Sansoni, G. ; Biancardi, L. ; Docchio, F. ; Minoni, U.
Author_Institution :
Dipart. di Elettronica per l´´Automazione, Brescia Univ., Italy
Volume :
43
Issue :
1
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
50
Lastpage :
55
Abstract :
In 3-D adaptive profilometry based on structured light projection, the choice of the low-pass filter to he used in the deformed pattern demodulation is crucial. In this paper, we have studied the performance of a typical finite impulse response (FIR) and of an infinite impulse response (IIR) Butterworth low-pass filter. Adaptiveness of the filters to both coarse and small variations of the grating frequency has been investigated. The ability of the filters to adapt to coarse changes of the grating frequency has been quantified in terms of their speed of synthesis, while the ability of the filters to tolerate small variations of the grating frequency has been quantified by measuring the residual phase errors. The analysis shows that the IIR Butterworth filter performs better than the FIR filter both in the coarse and in the fine grating frequency variation cases
Keywords :
adaptive optics; diffraction gratings; digital filters; low-pass filters; optical filters; optical sensors; spatial variables measurement; 3D adaptive profilometry; FIR filter; IIR filter; adaptiveness; coarse grating frequency variation; deformed pattern demodulation; demodulation; fine grating frequency variation; finite impulse response filter; grating frequency; industrial measurement; infinite impulse response Butterworth low-pass filter; low-pass filter; low-pass filters; projected gratings; residual phase errors; speed of synthesis; structured light projection; Adaptive filters; Demodulation; Finite impulse response filter; Frequency measurement; Frequency synthesizers; Gratings; IIR filters; Low pass filters; Phase measurement; Velocity measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.286354
Filename :
286354
Link To Document :
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