Title :
Sensor value validation based on systematic exploration of the sensor redundancy for fault diagnosis KBS
Author_Institution :
Dept. of Electr. & Comput. Eng., Tennessee Univ. Space Inst., Tullahoma, TN, USA
fDate :
4/1/1994 12:00:00 AM
Abstract :
For a physical system whose operating state is monitored by various sensors, one of the crucial steps involved in fault monitoring and diagnosis process is to validate the sensor values. A sensor value can be validated by observing redundant measurement values. When numerous sensors are installed at different locations in a system and if there exist certain relationships among the measured parameters, the redundancies of the sensors can be viewed as embedded throughout the system. In this paper, a technique is proposed that can systematically explore such embedded redundancies of the sensors in a system and utilize them in quickly validating sensor values. The technique is based on causal relations and their interrelations within sensor redundancy graphs (SRG´s) as defined in this paper. Any sensor in an SRG can potentially benefit from any other sensor involved in the same SRG in validation. A validity level is defined and used to express the strength of the validity of a sensor value as supported by varying degrees of evidence. The validation results also yield valuable clues to the systems´ fault diagnosis knowledge-based systems on the occurrences of system faults and their locations
Keywords :
automatic testing; computerised monitoring; fault location; graph theory; knowledge based systems; redundancy; sensor fusion; causal relations; fault diagnosis; fault monitoring; knowledge based systems; redundant measurement values; sensor redundancy; sensor redundancy graphs; sensor value validation; systematic exploration; Aerospace industry; Control systems; Electrical equipment industry; Fault diagnosis; Knowledge based systems; Monitoring; Noise measurement; Redundancy; Sensor phenomena and characterization; Sensor systems;
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on