• DocumentCode
    1090749
  • Title

    Purging: A reliability assurance technique for new technology semiconductor devices

  • Author

    Gordon, E.I. ; Nash, F.R. ; Hartman, R.L.

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    4
  • Issue
    12
  • fYear
    1983
  • fDate
    12/1/1983 12:00:00 AM
  • Firstpage
    465
  • Lastpage
    466
  • Abstract
    A new reliability assurance philosophy is described that represents the Bell System approach to solving the difficult problem of providing new device technology for early system deployment with well characterized and desirable reliability characteristics. This philosophy is especially important for high reliability systems such as satellites and submarine cables. It is based on the use of very high stresses, both thermal and nonthermal, to eliminate failure modes which are only weakly temperature activated, and to stabilize degradation rates. The technique is called "purging."
  • Keywords
    Aging; Costs; Degradation; Job shop scheduling; Laser modes; Marine technology; Semiconductor device reliability; Semiconductor devices; Thermal stresses; Underwater cables;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25804
  • Filename
    1483548