DocumentCode
1090749
Title
Purging: A reliability assurance technique for new technology semiconductor devices
Author
Gordon, E.I. ; Nash, F.R. ; Hartman, R.L.
Author_Institution
Bell Laboratories, Murray Hill, NJ
Volume
4
Issue
12
fYear
1983
fDate
12/1/1983 12:00:00 AM
Firstpage
465
Lastpage
466
Abstract
A new reliability assurance philosophy is described that represents the Bell System approach to solving the difficult problem of providing new device technology for early system deployment with well characterized and desirable reliability characteristics. This philosophy is especially important for high reliability systems such as satellites and submarine cables. It is based on the use of very high stresses, both thermal and nonthermal, to eliminate failure modes which are only weakly temperature activated, and to stabilize degradation rates. The technique is called "purging."
Keywords
Aging; Costs; Degradation; Job shop scheduling; Laser modes; Marine technology; Semiconductor device reliability; Semiconductor devices; Thermal stresses; Underwater cables;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1983.25804
Filename
1483548
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