Title :
Reliability assurance for devices with a sudden-failure characteristic
Author :
Saul, R.H. ; Chen, F.S.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
fDate :
12/1/1983 12:00:00 AM
Abstract :
Reliability assurance is particularly challenging for devices which have a sudden-failure characteristic. The use of a purging procedure which utilizes high thermal and nonthermal stresses is shown to have considerable promise in identifying for removal devices which otherwise fail early in the system life cycle.
Keywords :
Aging; Dark current; Indium gallium arsenide; Life estimation; Life testing; Photodiodes; Robustness; Temperature measurement; Thermal stresses; Underwater cables;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1983.25805
