Title :
Wide-wavelength and low-dark-current lattice-mismatched GaInAs photodiodes
Author :
Wada, Masaki ; Sakakibara, Kunio ; Higuchi, Masanori ; Sekiguchi, Yuta
Author_Institution :
Opt. Meas. Technol. Dev. Co. Ltd., Tokyo, Japan
fDate :
4/9/1992 12:00:00 AM
Abstract :
A lattice-mismatched GaInAs photodiode with low dark current and very wide-wavelength spectral response has been fabricated on InP substrate. The uses of a lattice-mismatched GaInAs light-absorbing layer and a very thin InP cap layer provide extended responsivity for longer and shorter wavelengths, respectively. To improve the crystal quality of the lattice-mismatched GaInAs layer a strained-superlattice buffer layer was used, with a combined thermal cycle annealing process, resulting in a low dark current. The shallow p-n junction of the photodiode was formed by a newly developed Zn diffusion technique.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; photodiodes; GaInAs:Zn-InP; InP cap layer; InP substrate; Zn diffusion technique; lattice-mismatched; light-absorbing layer; low-dark-current; photodiodes; shallow p-n junction; strained-superlattice buffer layer; thermal cycle annealing process; wide-wavelength spectral response;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920473