Analysis of mode characteristics for equilateral triangle semiconductor microlasers with imperfect boundaries

Author

Huang, Y.-Z. ; Lu, Q.-Y. ; Guo, W.-H. ; Yu, L.-J.

Author_Institution

State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China

Volume

151

Issue

4

fYear

2004

Firstpage

202

Lastpage

204

Abstract

The influence of imperfect boundaries on the mode quality factor is investigated for equilateral-triangle-resonator (ETR) semiconductor microlasers by the finite difference time domain technique and the Pade approximation with Baker´s algorithm. For 2-D ETR with a refractive index of 3.2 and side length of 5 μm, the confined modes can still have a quality factor of about 1000 as small triangles with side length of 1 μm are cut from the vertices of the ETR. For a deformed 5 μm ETR with round vertices and curve sides, the simulated mode quality factors are comparable to the measured results.

Keywords

finite difference time-domain analysis; laser modes; microcavity lasers; refractive index; semiconductor lasers; 1 mum; 5 mum; Baker algorithm; Pade approximation; confined modes; equilateral triangle semiconductor microlasers; equilateral-triangle-resonator; finite difference time domain technique; imperfect boundaries; mode characteristics; mode quality factor; refractive index; stimulated mode quality factor;

fLanguage

English

Journal_Title

Optoelectronics, IEE Proceedings -

Publisher

iet

ISSN

1350-2433

Type

jour

DOI

10.1049/ip-opt:20040671

Filename

1331200