• DocumentCode
    1091102
  • Title

    Measuring the quantum correction at zero bias in metal-oxide-metal diode noise

  • Author

    van der Ziel, A. ; Sutherland, A.D.

  • Author_Institution
    University of Florida, Gainesville, FL, USA
  • Volume
    18
  • Issue
    1
  • fYear
    1982
  • fDate
    1/1/1982 12:00:00 AM
  • Firstpage
    17
  • Lastpage
    19
  • Abstract
    According to van der Ziel´s interpretation of Tucker´s calculation of the noise and admittance of metal-oxide-metal (MOM) diodes, these devices, when operating at high frequencies (100 GHz) and low temperatures (2 K), show a transition from quantum thermal noise at zero bias to shot noise at ±1 mV bias. By slowly modulating the bias of the MOM diode between -1 mV and +1 mV, mixing and amplifying the noise, passing it through a quadratic detector and then LF filtering the detected MOM noise power, one can display the MOM diode noise power on a cathode ray oscillograph or strip-chart recorder as a function of bias, and thus calibrate the thermal noise at zero bias against the shot noise at higher bias.
  • Keywords
    Diodes; MIM devices; Measurement noise; Millimeter-wave measurements; Noise measurement; Admittance; Detectors; Diodes; Filtering; Frequency; Gunshot detection systems; Low-frequency noise; Message-oriented middleware; Noise measurement; Temperature;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071378
  • Filename
    1071378