Title : 
Measuring the quantum correction at zero bias in metal-oxide-metal diode noise
         
        
            Author : 
van der Ziel, A. ; Sutherland, A.D.
         
        
            Author_Institution : 
University of Florida, Gainesville, FL, USA
         
        
        
        
        
            fDate : 
1/1/1982 12:00:00 AM
         
        
        
        
            Abstract : 
According to van der Ziel´s interpretation of Tucker´s calculation of the noise and admittance of metal-oxide-metal (MOM) diodes, these devices, when operating at high frequencies (100 GHz) and low temperatures (2 K), show a transition from quantum thermal noise at zero bias to shot noise at ±1 mV bias. By slowly modulating the bias of the MOM diode between -1 mV and +1 mV, mixing and amplifying the noise, passing it through a quadratic detector and then LF filtering the detected MOM noise power, one can display the MOM diode noise power on a cathode ray oscillograph or strip-chart recorder as a function of bias, and thus calibrate the thermal noise at zero bias against the shot noise at higher bias.
         
        
            Keywords : 
Diodes; MIM devices; Measurement noise; Millimeter-wave measurements; Noise measurement; Admittance; Detectors; Diodes; Filtering; Frequency; Gunshot detection systems; Low-frequency noise; Message-oriented middleware; Noise measurement; Temperature;
         
        
        
            Journal_Title : 
Quantum Electronics, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JQE.1982.1071378