مرکز منطقه ای اطلاع رساني علوم و فناوري - IEEE International Integrated Reliability Workshop (IIRW)

DocumentCode :

109118

Title :

IEEE International Integrated Reliability Workshop (IIRW)

Volume :

Issue :

fYear :

2013

fDate :

Jul-13

Firstpage :

2438

Lastpage :

2438

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Devices, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/TED.2013.2269165

Filename :

6542045

Link To Document :