• DocumentCode
    109118
  • Title

    IEEE International Integrated Reliability Workshop (IIRW)

  • Volume
    60
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    2438
  • Lastpage
    2438
  • Abstract
    Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2269165
  • Filename
    6542045
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=109118