• DocumentCode
    1091266
  • Title

    Reply to "comments on \´a method for determining energy gap narrowing in highly doped semiconductors\´"

  • Author

    Neugroschel, A. ; Lindholm, F.A.

  • Volume
    31
  • Issue
    1
  • fYear
    1984
  • fDate
    1/1/1984 12:00:00 AM
  • Firstpage
    124
  • Lastpage
    125
  • Abstract
    The interpretation by del Alamo and Swanson of recombination-current data in highly doped silicon is clarified by making explicit their key assumptions. This leads to our reaffirming the merit of using temperature dependence in determining energy gap narrowing. This use gives newly determined low values of minority-carrier mobility and diffusivity, accompanied by a simple physical picture recently published elsewhere.
  • Keywords
    Doping; Electron devices; P-n junctions; Photonic band gap; Photovoltaic systems; Semiconductor impurities; Silicon; Solar power generation; Solids; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21487
  • Filename
    1483772