DocumentCode
1091266
Title
Reply to "comments on \´a method for determining energy gap narrowing in highly doped semiconductors\´"
Author
Neugroschel, A. ; Lindholm, F.A.
Volume
31
Issue
1
fYear
1984
fDate
1/1/1984 12:00:00 AM
Firstpage
124
Lastpage
125
Abstract
The interpretation by del Alamo and Swanson of recombination-current data in highly doped silicon is clarified by making explicit their key assumptions. This leads to our reaffirming the merit of using temperature dependence in determining energy gap narrowing. This use gives newly determined low values of minority-carrier mobility and diffusivity, accompanied by a simple physical picture recently published elsewhere.
Keywords
Doping; Electron devices; P-n junctions; Photonic band gap; Photovoltaic systems; Semiconductor impurities; Silicon; Solar power generation; Solids; Temperature distribution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21487
Filename
1483772
Link To Document