DocumentCode :
1091266
Title :
Reply to "comments on \´a method for determining energy gap narrowing in highly doped semiconductors\´"
Author :
Neugroschel, A. ; Lindholm, F.A.
Volume :
31
Issue :
1
fYear :
1984
fDate :
1/1/1984 12:00:00 AM
Firstpage :
124
Lastpage :
125
Abstract :
The interpretation by del Alamo and Swanson of recombination-current data in highly doped silicon is clarified by making explicit their key assumptions. This leads to our reaffirming the merit of using temperature dependence in determining energy gap narrowing. This use gives newly determined low values of minority-carrier mobility and diffusivity, accompanied by a simple physical picture recently published elsewhere.
Keywords :
Doping; Electron devices; P-n junctions; Photonic band gap; Photovoltaic systems; Semiconductor impurities; Silicon; Solar power generation; Solids; Temperature distribution;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21487
Filename :
1483772
Link To Document :
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