DocumentCode :
1091303
Title :
Optical fiber and preform profiling technology
Author :
Stewart, W.J.
Author_Institution :
Plessey Research (Caswell) Limited, Allen Clark Research Centre, Caswell, Towcester, England
Volume :
18
Issue :
10
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
1451
Lastpage :
1466
Abstract :
A comprehensive review of state-of-the-art optical fiber and preform index-profiling methods has been prepared. The advantages and disadvantages of the various approaches are discussed. Important parameters include measurement accuracy, resolution, simplicity, and the nondestructive features of some methods. Both optical and nonoptical techniques have been treated. Resolution considerations probably favor the refracted near-field technique and this may be a decisive factor for the measurement of single-mode fibers. Simplicity of apparatus lies with near-field methods generally so that the bound near-field method is most often used for dimensional measurements. Preform profiling is dominated by deflection function methods, usually accompanied by spatial filtering or focusing. Methods restricted to certain classes of fiber, such as the far-field approaches, are less attractive and, consequently, do not receive as much use.
Keywords :
Bibliographies; Optical fiber measurements; Optical refraction; Bandwidth; Length measurement; Optical attenuators; Optical fibers; Optical filters; Optical refraction; Preforms; Refractive index; Shape; Wavelength measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1982.1071398
Filename :
1071398
Link To Document :
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