• DocumentCode
    1091306
  • Title

    A subnanosecond 2000 gate array with ECL 100K compatibility

  • Author

    Sato, Fumihiko ; Takahashi, Toru ; Misawa, Hiroyuki ; Kimura, Kodo

  • Author_Institution
    NEC Corporation, Kanagawa, Japan
  • Volume
    31
  • Issue
    2
  • fYear
    1984
  • fDate
    2/1/1984 12:00:00 AM
  • Firstpage
    139
  • Lastpage
    143
  • Abstract
    This paper describes a subnanosecond gate array with 2000 gate complexity using an advanced bipolar process. The high performance of this process and the optimized circuit design have made it possible to achieve a 700-ps delay time for a basic ECL gate under a general usage condition of a 3 fan-in, 3 fan-out and 3-mm wiring length, in spite of a low power dissipation of 1.9 mW/gate. A 450-MHz typical toggle frequency has been obtained by using a series-gated flip-flop. Utilizing the integrated computer aided design (CAD) system, a quick and error-free design can be achieved. As a result, 100 percent routability has been attained for automatic placement and wiring in spite of 90 percent cell utilization. Low thermal resistance (6°C/W) packages are employed for this LSI chip to enable installation in an air cooled system.
  • Keywords
    Circuit synthesis; Computer errors; Delay effects; Design automation; Design optimization; Flip-flops; Frequency; Power dissipation; Thermal resistance; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21491
  • Filename
    1483776