Title :
Measurement and analysis of periodic coupling in silicon-clad planar waveguides
Author :
McWright, G. ; Batchman, T.E. ; Stanziano, M.S.
Author_Institution :
Univ. of Virginia, Charlottesville, VA, USA
fDate :
10/1/1982 12:00:00 AM
Abstract :
Computer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE0mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
Keywords :
Optical planar waveguide couplers; Semiconductor films; Semiconductor-loaded waveguides; Silicon materials/devices; Attenuation; Dielectric losses; Dielectric measurements; Optical films; Optical filters; Optical losses; Optical modulation; Optical waveguides; Planar waveguides; Silicon;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1982.1071421