DocumentCode :
109157
Title :
Parameterization of Free Carrier Absorption in Highly Doped Silicon for Solar Cells
Author :
Rudiger, Marc ; Greulich, Johannes ; Richter, A. ; Hermle, M.
Author_Institution :
Fraunhofer Inst. for Solar Energy Syst. ISE, Freiburg, Germany
Volume :
60
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
2156
Lastpage :
2163
Abstract :
Free carrier absorption (FCA) is a parasitic absorption process in highly doped silicon that might significantly reduce the amount of photons, potentially generating electron-hole pairs. Existing FCA parameterizations are mostly setup by evaluating absorption data in the range λ ≥ 4 μm. If applied in the wavelength range λ = 1.0-2.0 μm, including the relevant range for silicon solar cells, most parameterizations are not appropriate to describe FCA accurately. In this paper, new parameters are presented using optical simulation on the base of experimental reflection data to enhance the quantification of FCA losses in the considered wavelength range.
Keywords :
absorption coefficients; electron-hole recombination; elemental semiconductors; reflection; silicon; solar cells; FCA loss quantification; FCA parameterizations; Si; absorption data; electron-hole pairs; free carrier absorption parameterization; highly doped silicon solar cells; optical simulation; parasitic absorption process; photons; reflection data; wavelength 1.0 mum to 2.0 mum; Free carrier absorption (FCA); silicon devices;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2262526
Filename :
6542048
Link To Document :
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