DocumentCode :
1091682
Title :
Theory of amorphous-silicon charge-coupled devices
Author :
Naruke, Yasuo ; Kishida, Satoru ; Uchida, Yasutaka ; Matsumura, Masakiyo
Author_Institution :
Tokyo Institute of Technology, Tokyo, Japan
Volume :
31
Issue :
3
fYear :
1984
fDate :
3/1/1984 12:00:00 AM
Firstpage :
362
Lastpage :
366
Abstract :
The theory of operation of amorphous-silicon charge-coupled devices has been studied numerically and analytically under the assumption that the localized states in amorphous-silicon are distributed exponentially with respect to energy. The transfer inefficiency ε is found to depend not only on the localized state density but also on the transit time and initial density of signal electrons. The approximate analysis shows that \\ln(\\epsilon) is a linear function of logarithmic clock frequency, and that its coefficient is given by the characteristic temperature which represents the steepness of the localized state density distribution in amorphous-silicon.
Keywords :
Charge coupled devices; Clocks; Electrodes; Electrons; Equivalent circuits; Leakage current; Photonic band gap; Research and development; Semiconductor thin films; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21528
Filename :
1483813
Link To Document :
بازگشت