Title : 
Process/Temperature Variation Tolerant Precision Signal Strength Indicator
         
        
            Author : 
Yang, Chao ; Mason, Andrew
         
        
            Author_Institution : 
Michigan State Univ., East Lansing
         
        
        
        
        
            fDate : 
4/1/2008 12:00:00 AM
         
        
        
        
            Abstract : 
A receiving signal strength indicator (RSSI) built with transconductance amplifiers is presented. The RSSI achieves high tolerance to process/temperature variations by utilizing the unique nature of branch currents in a transconductance amplifier. These branch currents are used to implement a current-mode rectifier and amplitude clipping circuit that are tolerant of process variations. An on-chip offset control loop permits the entire RSSI to be realized with only one external component. In 0.18-mum CMOS with a 1.8 V supply, the RSSI draws 2.5 mA and provides 80 dB of offset suppression and more than 75 dB of log-linear range with less than +/ - 2-dB error due to process variation.
         
        
            Keywords : 
CMOS analogue integrated circuits; amplifiers; current-mode circuits; rectifiers; CMOS; amplitude clipping circuit; current 2.5 mA; current-mode rectifier; process variation; receiving signal strength indicator; size 0.18 mum; temperature variation; transconductance amplifiers; voltage 1.8 V; CMOS analog integrated circuit; RSSI; receiving signal strength indicator (RSSI); signal strength indicator; wireless communication;
         
        
        
            Journal_Title : 
Circuits and Systems I: Regular Papers, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TCSI.2008.919747