• DocumentCode
    1091728
  • Title

    A method for the direct measurement of solar cell shunt resistance

  • Author

    Chan, Daniel S H ; Phang, Jacob C H

  • Author_Institution
    National University of Singapore, Kent Ridge, Singapore
  • Volume
    31
  • Issue
    3
  • fYear
    1984
  • fDate
    3/1/1984 12:00:00 AM
  • Firstpage
    381
  • Lastpage
    383
  • Abstract
    A method is described for the direct measurement of the shunt resistance of a solar cell, in which a prior knowledge of the value of the other lumped circuit parameters is not required. The shunt resistance is determined from measurements of open-circuit voltage and short-circuit current at very low illumination conditions under which a linear relationship exists such that V_{oc} = R_{sh} I_{sc} . The shunt resistances of three different commercial cells ranging between 65 and 1170 Ω were measured successfully. The constraints of the method are also discussed.
  • Keywords
    Breakdown voltage; Circuits; Current measurement; Electric breakdown; Electrical resistance measurement; Jacobian matrices; Lighting; P-n junctions; Photovoltaic cells; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21532
  • Filename
    1483817
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1091728