DocumentCode :
1091928
Title :
Modeling and characterization for high-speed GaAlAs-GaAs n-p-n heterojunction bipolar transistors
Author :
Kurata, Mamoru ; Yoshida, Jiro
Author_Institution :
Toshiba Research and Development Center, Kawasaki, Japan
Volume :
31
Issue :
4
fYear :
1984
fDate :
4/1/1984 12:00:00 AM
Firstpage :
467
Lastpage :
473
Abstract :
A numerical one-dimensional model is employed to predict dc and switching characteristics for n-p-n type GaAlAs-GaAs transistors, including heteroemitter-homocollector and heteroemitter-heterocollector junction structure, where four kinds of doping profiles are considered. Also, Si and GaAs homojunction transistors are referred to for comparison. Switching performance is discussed for a single unit case, with and without a base resistance, and for a DCTL-type two-stage inverter case, including the delay time dependence on fanout.
Keywords :
Capacitance; Charge carrier processes; Doping profiles; Equations; Gallium arsenide; Heterojunction bipolar transistors; Inverters; Numerical models; Photonic band gap; Semiconductor process modeling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21552
Filename :
1483837
Link To Document :
بازگشت