• DocumentCode
    1091935
  • Title

    Mode coupling effects in stress-applied single polarization fibers

  • Author

    Okamoto, Katsunari ; Sasaki, Yutaka ; Shibata, Noriyoshi

  • Author_Institution
    NTT Public Corp., Tokai, Ibaraki, Japan
  • Volume
    18
  • Issue
    11
  • fYear
    1982
  • fDate
    11/1/1982 12:00:00 AM
  • Firstpage
    1890
  • Lastpage
    1899
  • Abstract
    Mode coupling effects caused by waveguide imperfections and ambient fluctuations in the stress-applied single polarization fibers have been investigated. Several origins of mode coupling, such as: 1) core deformations, 2) deformation of stress-applying parts, 3) micro-bending, and 4) temperature fluctuations, have been treated. The mode coupling parameters between the orthogonally polarized HE11modes are compared for various kinds of waveguide imperfections and ambient fluctuations. It was clarified that the deformation of the stress-applying parts is the dominant factor in the mode coupling effects in stress-applied single polarization fibers.
  • Keywords
    Coupled mode analysis; Optical fiber mechanical factors; Anisotropic magnetoresistance; Birefringence; Capacitive sensors; Fluctuations; Helium; Optical fiber communication; Optical fiber polarization; Optical waveguides; Temperature; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071456
  • Filename
    1071456
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1091935