DocumentCode
1091963
Title
Deep levels at p-n and n-p AlGaAs-GaAs heterojunction interfaces
Author
Rys, Andrzej ; Burrows, Ian L C ; Portnoy, William M.
Author_Institution
Kansas State University, Manhattan, KS
Volume
31
Issue
4
fYear
1984
fDate
4/1/1984 12:00:00 AM
Firstpage
500
Lastpage
505
Abstract
Forward current-voltage measurements and DLTS spectra were obtained for p--n and n--p Al0.3 Ga0.7 As-GaAs heterodiodes. The current-voltage measurements support a tunneling current model for the p--n diodes and a diffusion-recombination current model for the n--p diodes. No deep levels were observed for the p--n structure, but two new levels at about 0.1 and 0.4 eV below the conduction band edge, and possibly zinc related, were found in the n--p devices.
Keywords
Buffer layers; Current measurement; Diodes; Gallium arsenide; Heterojunctions; Impurities; Palladium; Tin; Tunneling; Zinc;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21556
Filename
1483841
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