• DocumentCode
    1092029
  • Title

    Self-learning fuzzy logic system for in situ, in-process diagnostics of mass flow controller (MFC)

  • Author

    Ramamurthi, Ram K.

  • Author_Institution
    Semicond. Process & Design Center, Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    7
  • Issue
    1
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    52
  • Abstract
    An improvement in the yield of better quality wafers requires an accurate control of various process variables. The control should include timely diagnosis and appropriate in-situ, in-process adjustments for drifts in these variables. One such scheme, a self-learning fuzzy logic system, is developed in this study for correcting drifts in the calibration of mass flow controllers (MFC´s) that control the flow of gases into a process chamber. It consists of two components; a diagnostic system and a self-learning system. The diagnostic system uses fuzzy logic to diagnose the problem and initiate suitable remedial action, The self-learning system automatically builds the knowledge base used for diagnosis. The knowledge base is initialized using clustering principle and is tuned for better performance using a set of heuristic rules. The system is capable of learning the behavior of different types of makes and models of MFC´s under various flow rates. It has been tested on two different types of MFC´s under different flow rates and encouraging results have been obtained
  • Keywords
    calibration; diagnostic expert systems; flow control; fuzzy control; fuzzy logic; integrated circuit manufacture; intelligent control; learning systems; process computer control; self-adjusting systems; semiconductor device manufacture; calibration drift correction; clustering principle; fuzzy logic system; gas flow control; heuristic rules; in situ in-process diagnostics; knowledge base; mass flow controller; process chamber; self-learning system; wafer yield improvement; Automatic control; Autoregressive processes; Control systems; Fuzzy logic; Manufacturing processes; Process control; Semiconductor device modeling; Semiconductor process modeling; Testing; Weight control;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.286827
  • Filename
    286827