DocumentCode
1092262
Title
Optical absorption of thin film on a Lambertian reflector substrate
Author
Sheng, Ping
Author_Institution
Exxon Corporate Research Science Laboratories, Clinton Township, Annandale, NJ
Volume
31
Issue
5
fYear
1984
fDate
5/1/1984 12:00:00 AM
Firstpage
634
Lastpage
636
Abstract
A formula is derived for calculating the optical absorption of thin films deposited on a Lambertian reflector substrate. It is shown that compared with the case of flat reflecting substrate, the incoherent absorption is enhanced by a factor of
in the weak absorption limit, where ε1 is the real part of the film dielectric constant and
is a slightly varying function of ε1 . For a 0.5-µm a-SiHx (bandgap 1.7 eV) solar cell with a Lambertian reflector substrate, the total absorption in terms of the short-circuit current is calculated to be 18.63 mA/cm2.
in the weak absorption limit, where ε
is a slightly varying function of εKeywords
Absorption; Dielectric constant; Dielectric substrates; Dielectric thin films; Light scattering; Optical films; Optical reflection; Optical scattering; Optical surface waves; Sputtering;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21582
Filename
1483867
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