• DocumentCode
    1092262
  • Title

    Optical absorption of thin film on a Lambertian reflector substrate

  • Author

    Sheng, Ping

  • Author_Institution
    Exxon Corporate Research Science Laboratories, Clinton Township, Annandale, NJ
  • Volume
    31
  • Issue
    5
  • fYear
    1984
  • fDate
    5/1/1984 12:00:00 AM
  • Firstpage
    634
  • Lastpage
    636
  • Abstract
    A formula is derived for calculating the optical absorption of thin films deposited on a Lambertian reflector substrate. It is shown that compared with the case of flat reflecting substrate, the incoherent absorption is enhanced by a factor of m\\epsilon_{1} in the weak absorption limit, where ε1is the real part of the film dielectric constant and m \\simeq 2 is a slightly varying function of ε1. For a 0.5-µm a-SiHx(bandgap 1.7 eV) solar cell with a Lambertian reflector substrate, the total absorption in terms of the short-circuit current is calculated to be 18.63 mA/cm2.
  • Keywords
    Absorption; Dielectric constant; Dielectric substrates; Dielectric thin films; Light scattering; Optical films; Optical reflection; Optical scattering; Optical surface waves; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21582
  • Filename
    1483867