Title :
Simulation study of a field emission triode structure using carbon-nanotube emitters
Author_Institution :
Microelectron. & Phys. Sci. Labs., Motorola Inc., Tempe, AZ, USA
Abstract :
The device level simulation analysis without considering nanometer geometry of the emissive material is carried out on a self-aligned gated field emission triode structure that can be used for low electric-field emissive materials such as carbon nanotubes. The electric properties of the device, such as electric-field distribution, pixel capacitance, and gate controllability, are simulated using a commercially available field solver based on the boundary-element method. The simulation results show that the depletion-mode operation can eliminate high electric field near the triple-junction regions and produce better uniform emission, comparing enhanced mode operation. The detail of the depletion mode operation is discussed. We also calculate the effect of the gate thickness on pixel emission current and suggest control of the variation of gate layer depostion within 3% in short distance and 20%-30% over the whole display area.
Keywords :
boundary-elements methods; capacitance; carbon nanotubes; field emission displays; nanotube devices; triodes; C; boundary-element method; carbon-nanotube emitters; depletion-mode operation; device level simulation analysis; display area; electric properties; electric-field distribution; enhanced mode operation; field solver; gate controllability; gate layer deposition; gate thickness; low electric-field emissive materials; pixel capacitance; pixel emission current; self-aligned gated field emission triode structure; triple-junction regions; uniform emission; Analytical models; Capacitance; Carbon nanotubes; Controllability; Displays; Geometry; Nanoscale devices; Organic materials; Solid modeling; Thickness control; CNT; Carbon nanotube; FED; depletion mode; electric-field simulation; electron emission; field emission display; pixel response time;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2004.834158