Title :
Simulation of microelectrode impedance changes due to cell growth
Author :
Huang, Xiaoqiu ; Nguyen, Duc ; Greve, David W. ; Domach, Michael M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie-Mellon Univ., Pittsburgh, PA, USA
Abstract :
Observation of impedance changes caused by cell growth on microelectrodes provides information about cell coverage and other important quantities, such as the cell-electrode gap. In this paper, we use finite-element simulations to calculate the impedance changes caused by cell growth on electrodes comparable in size to the cell. Parameters describing the impedance of the electrode without cells are derived from measurement. The results show that the impedance magnitude is expected to increase by at least 100% for partial cell coverage. We also report the frequency dependence of the magnitude and phase of the impedance and compare the simulation results with a lumped-element model. The simulation results are important for the design and modeling of arrays of cell-sized electrodes and also for the interpretation of experiments.
Keywords :
biomedical electrodes; finite element analysis; microelectrodes; cell growth; cell-electrode gap; finite-element simulations; impedance magnitude; lumped-element model; microelectrode impedance; Biological system modeling; Cells (biology); Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Finite element methods; Impedance measurement; Microelectrodes; Monitoring;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2004.831302